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Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
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Publication date: 2012-04-15
Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
Publication date: 2011-08-01
Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
Publication date: 2010-11-15
Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
Publication date: 2010-05-01
Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
Pages: 12
Publication date: 2005-06-01
Surface chemical analysis - Auger electron spectroscopy - Repeatability and constancy of intensity scale
Pages: 14
Publication date: 2005-04-15
Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
Pages: 13
Publication date: 2004-06-01
Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
Pages: 11
Publication date: 2002-10-15
Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
Pages: 27
Publication date: 2002-10-01
Pages: 40
Publication date: 2019-08-01